发明名称 Method and apparatus for particle analysis
摘要 The apparatus comprises a cell 2 containing the sample 1 under investigation. Electromagnetic waves P1,P2 are applied from opposite directions and interfere with one another in the region of the cell to form a standing wave pattern 6. DUe to electrostriction effects the standing wave pattern causes particles within the sample to concentrate in certain areas in a pattern corresponding to that of the standing wave 6. This pattern of particle concentration forms a grating when seen by an input wave Pin of electromagnetic wave radiation and, provided conditions are correct, results in the generation of a phase conjugate wave Pout. Means (not shown) are provided for measuring the intensity of the phase conjugate wave Pout which gives a sensitive measure of the size of the particles suspended in the sample.
申请公布号 US4886360(A) 申请公布日期 1989.12.12
申请号 US19870096408 申请日期 1987.09.15
申请人 AMERSHAM INTERNATIONAL PLC 发明人 FINLAN, MARTIN F.
分类号 G01N15/10;G01J9/02;G01N15/02;G01N15/14;G01N21/63;G01N30/02;G01N33/53 主分类号 G01N15/10
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