发明名称 Method for producing semiconductor device
摘要 In producing TFT by crystallizing an amorphous silicon film by the action of nickel, the influence of nickel on the TFT produced is inhibited. A mask 104 is formed over an amorphous silicon film 102, and a nickel-containing solution is applied thereover. In that condition, nickel is kept in contact with the surface of the amorphous silicon film at the opening 103 of the mask. Then, this is heated to crystallize the amorphous silicon film. Next, a phosphorus-containing solution is applied thereto, so that phosphorus is introduced into the silicon film in the region of the opening 103. This is again heated, whereby nickel is gettered in the region into which phosphorus has been introduced. In this process, the nickel concentration in the silicon film is reduced.
申请公布号 US6156590(A) 申请公布日期 2000.12.05
申请号 US19980098004 申请日期 1998.06.16
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI, SHUNPEI;OHTANI, HISASHI;OHNUMA, HIDETO
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/00 主分类号 H01L21/20
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