发明名称 ION BEAM SPUTTERING APPARATUS
摘要 PURPOSE:To enable the formation of a thin film without mixture of impurity except a target material by using an electrostatic lens, thereby emitting an ion beam only on the surface of the target. CONSTITUTION:In an ion beam sputtering apparatus which introduces gas such as Ar to an ion source 1, tripping ions produced in the source into a high vacuum zone 2, emitting the tripped ion beam 3 to a target substance 4 on a target holder 6 placed obliquely with respect to the ion beam 3, sputters its atoms from the substance 4 and adheres the atoms on a substrate 5, an electrostatic lens 7 is provided at a position C between the source 1 and an ion neutralization filament 8. When a voltage is applied to the lens, the diameter of the ion beam is controlled to emit the ion beam only on the target surface.
申请公布号 JPS57106114(A) 申请公布日期 1982.07.01
申请号 JP19800183425 申请日期 1980.12.24
申请人 FUJITSU KK 发明人 KAWAI SATORU;KODAMA TOSHIROU;OZAWA KIYOSHI;TAKAGI NOBUYOSHI
分类号 C23C14/46;H01L21/203;H01L21/285 主分类号 C23C14/46
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