| 摘要 |
PROBLEM TO BE SOLVED: To accurately judge a flaw even in a restricted tact time. SOLUTION: This flaw inspection device is constituted so that the surface of a test piece is photographed to acquire an original image (step A1), the average value of the brightness values of a noticiable pixel and its peripheral pixel is calculated on the basis of the original image and a filtered image wherein the calculated average value is replaced with the brightness value of the noticiable pixel is formed (step A2), the corresponding brightness value of the pixel of the filtered image is subtracted from the brightness value of the pixel of the original image to form a differential image (step A3), in a case that the brightness value of the pixel of the differential image is higher than a threshold value, the brightness value of the pixel is replaced with 1 and, when the brightness value of the pixel of the differential image is not higher than the threshold value, the brightness value of the pixel is replaced with zero to form a binary image (step A4) and the presence of a flaw is judged with respect to the binary image (steps A5, A6). COPYRIGHT: (C)2007,JPO&INPIT
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