发明名称 PROBER DEVICE
摘要 <p>PURPOSE: To solve the problem in connection between a vertical contact assembled at a narrow pitch and a connecting terminal on a printed wiring board left in a coarse pitch as it is in a prober device. CONSTITUTION: The vertical contact piece 1 is used for a probe. This prober device is provided with a contact piece assembly 5a formed by regularly arranging a plurality of vertical contact pieces 1 and uniting the same in one body, a flexible flat cable 2 formed by bonding a wiring 11 on the surface of a non- conductive flexible film 10, and a fixing device 3 to which one end of the flexible flat cable 2 is fixed. A wiring terminal 9a formed at one end of the flexible flat cable 2 fixed to the fixing device 3 and the contact piece assembly 5a are brought into contact with each other, a wiring terminal 9b formed at the other end is connected to the print wiring board 4, and a semiconductor chip to be inspected and the printed wiring board 4 are electrically connected through the contact piece assembly 5a and the flexible flat cable 2.</p>
申请公布号 KR20030020238(A) 申请公布日期 2003.03.08
申请号 KR20020051822 申请日期 2002.08.30
申请人 KIMOTO GUNSEI 发明人 KIMOTO GUNSEI
分类号 G01R31/26;G01R1/04;G01R1/06;G01R1/073;H01L21/66;(IPC1-7):H01L21/66 主分类号 G01R31/26
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