| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing terminal for chip type electronic part capable of precisely measuring characteristic without exposing an internal electrode layer constituting the outer electrode of a chip type electronic part, and a testing method and testing device using it. SOLUTION: The chip type electronic part 10 housed in the housing part 34 of a turntable 32 is sucked by a suction part 44 formed on a side guard 36, and positioned in a prescribed place. The linear tapered part 52 of the inspecting terminal 40 is pressed onto the external electrode 14 of the electronic part 10 from a bottom surface 38. The angle of the tapered part 52 at the tip of the testing terminal 40 is set to an obtuse angle. The linear tapered part 52 is brought into contact with the external electrode 14 to be substantially in parallel to the longitudinal direction thereof. |
