发明名称 SAMPLING CIRCUIT AND AMPLIFICATION TYPE SOLID STATE IMAGING DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a sampling circuit not affected by the unevenness of a capacity between an input and an output of an amplifying means, and an amplification type solid state image sensor having an extremely small occurrence of a fixed pattern noise and high performance. SOLUTION: The sampling circuit comprises a sample and hold switch 148 inputting an input signal to its one terminal, a first sample and hold means having a sample and hold capacitor 149 connected at its one terminal to the other terminal of the switch 148, an amplifying circuit 155 connected at its input terminal to the other terminal of the switch 148, and a horizontal selection switch 156 connected at its one terminal to the output terminal of the amplifying circuit 155 and connected at the other terminal to a horizontal signal line 164. The output terminal of the circuit 155 is connected to the one terminal of a conduction control switch 157, and a first constant-current load 15 is connected to the other terminal of the switch 157. The switch 157 is turned on during a period in which the switch 148 is on and the switch 156 is off.
申请公布号 JP2002158934(A) 申请公布日期 2002.05.31
申请号 JP20000356223 申请日期 2000.11.22
申请人 SHARP CORP 发明人 WATANABE YASUSHI
分类号 H01L27/146;G11C27/02;H04N5/335;H04N5/363;H04N5/365;H04N5/369;H04N5/374;H04N5/3745;H04N5/378;(IPC1-7):H04N5/335 主分类号 H01L27/146
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