发明名称 THICKNESS GAUGE FOR MULTI-POINT MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To provide a thickness gauge for multi-point measurement by means of which the difference about the sensitivity for radiation of an ionization chamber becomes small in the width direction, and a more accurate measurement of board thickness can be carried out. SOLUTION: The ionization chamber 5, which is arranged in a detecting section 2, is turned around in the clockwise or counterclockwise direction in relation to the direction in which an object to be measured 4 flows. Thereby, a low sensitive region for the radiation, i.e., dead zone, which exists in conventional arrangement of the ionization chamber, can be eliminated, and the measurement of the object to be measured 4 is carried out continuously and accurately in the width direction.
申请公布号 JP2002328016(A) 申请公布日期 2002.11.15
申请号 JP20020013937 申请日期 2002.01.23
申请人 TOSHIBA CORP 发明人 KAGAWA TAKESHI
分类号 G01B15/02;G01N23/16;(IPC1-7):G01B15/02 主分类号 G01B15/02
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