| 摘要 |
Hexavalent chromium in electronic components and assemblies is measured using x-ray fluorescence spectroscopy to analyze the sample to identify the matrix. Based on the ascertained matrix, a protocol is selected from a variety of extraction and analysis protocols, and the hexavalent chromium is extracted from the sample using the selected protocol. The extracted hexavalent chromium is reacted with 1,5 diphenylcarbazide and measured using ultraviolet spectroscopy using a unique calibration curve for each type of identified matrix. Based on the measured amount of hexavalent chromium, the concentration of hexavalent chromium is calculated as a function of a unit area of the sample.
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