发明名称 Optical system of a microlithographic projection exposure apparatus
摘要 The invention relates to an optical system of a microlithographic projection exposure apparatus, comprising at least one mirror arrangement having a plurality of mirror elements which are adjustable independently of one another for the purpose of changing an angular distribution of the light reflected by the mirror arrangement, and a polarization-influencing optical element, which generates, for impinging light having a constantly linear or a circular input polarization distribution, an output polarization distribution having a direction of polarization that varies continuously over the light beam cross section.
申请公布号 US9405202(B2) 申请公布日期 2016.08.02
申请号 US201514737965 申请日期 2015.06.12
申请人 Carl Zeiss SMT GmbH 发明人 Saenger Ingo;Hennerkes Christoph
分类号 G03B27/28;G03B27/54;G03F7/20 主分类号 G03B27/28
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. An optical system, comprising: a mirror arrangement comprising a plurality of mirror elements, the plurality of mirror elements being adjustable independently relative to each other to change an angular distribution of light reflected by the mirror arrangement; and a polarization-influencing optical element configured so that, when light having a constantly linear polarization distribution or a circular input polarization distribution impinges on the polarization-influencing optical element, the polarization-influencing optical element generates a light beam having an output polarization distribution with a direction of polarization that varies continuously over a cross-section of the light beam, wherein: the polarization-influencing optical element has a geometry selected from the group consisting of a plane-parallel geometry and a wedge-section-shaped geometry; andthe optical system is a microlithographic optical system.
地址 Oberkochen DE