发明名称 |
Semiconductor circuit device and method for production thereof |
摘要 |
A semiconductor circuit device is disclosed in which an impurity ion implanted region is formed in a substrate, a Schottky junction type gate electrode is formed above the impurity ion implanted region, and a source electrode and a drain electrode are formed on both sides of the gate electrode. In this device, an InGaP barrier layer is formed between the substrate and the electrodes, a cap layer comprising a semiconductor free from In as a constituent is formed between the InGaP barrier layer and the electrodes, and the gate electrode is formed of a refractory metal.
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申请公布号 |
US5406098(A) |
申请公布日期 |
1995.04.11 |
申请号 |
US19940285307 |
申请日期 |
1994.08.03 |
申请人 |
NIPPON TELEGRAPH & TELEPHONE CORPORATION |
发明人 |
HYUGA, FUMIAKI;SHIOJIMA, KENJI;AOKI, TATSUO;ASAI, KAZUYOSHI;TOKUMITSU, MASAMI;NISHIMURA, KAZUMI;YAMANE, YASURO |
分类号 |
H01L21/335;H01L21/8252;H01L27/06;H01L29/08;H01L29/80;(IPC1-7):H01L29/80 |
主分类号 |
H01L21/335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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