发明名称 |
Random access memory cell and method for fabricating same |
摘要 |
<p>A random access memory cell and fabrication method therefor are disclosed. The random access memory cell includes a first and a second pull-down transistor crosscoupled such that a control terminal of the first pull-down transistor is connected to a conduction terminal of the second pull-down transistors, and the control terminal of the second pull-down transistor is connected to the conduction terminal of the first pull-down transistor. A first pass gate transistor is coupled between the conduction terminal of the first transistor and a first bit line of a bit line pair, and a second pass gate transistor is coupled between the conduction terminal of the second transistor and a second bit line of the bit line pair. The threshold voltage of the first and second pass gate transistors is such that a subthreshold current is provided to the first and second pull-down transistors when the memory cell is not being accessed such that the conduction terminal of the pull-down transistor that is turned off is maintained at a voltage level corresponding to a logic high voltage. In this way, the memory cell is capable of performing a latching function without pull-up transistors. <IMAGE></p> |
申请公布号 |
EP1168360(A1) |
申请公布日期 |
2002.01.02 |
申请号 |
EP20010305263 |
申请日期 |
2001.06.18 |
申请人 |
STMICROELECTRONICS, INC. |
发明人 |
FERRANT, RICHARD J.;CHAN, T.C. |
分类号 |
H01L27/11;G11C11/412;H01L21/8244;(IPC1-7):G11C11/412 |
主分类号 |
H01L27/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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