Methods and apparatus for testing a component,申请号EG20050110476-传众专利搜索

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发明名称	Methods and apparatus for testing a component
摘要
申请公布号	EG24333(A)	申请公布日期	2009.01.27
申请号	EG20050110476	申请日期	2005.11.16
申请人	GENERAL ELECTRIC COMPANY	发明人	UI WON SUH
分类号	G01N27/90;G01B7/28	主分类号	G01N27/90
代理机构		代理人
主权项
地址

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