发明名称 |
Die stacks with one or more bond via arrays of wire bond wires and with one or more arrays of bump interconnects |
摘要 |
An apparatus relating generally to a die stack is disclosed. In such an apparatus, a substrate is included. A first bond via array includes first wires each of a first length extending from a first surface of the substrate. An array of bump interconnects is disposed on the first surface. A die is interconnected to the substrate via the array of bump interconnects. A second bond via array includes second wires each of a second length different than the first length extending from a second surface of the die. |
申请公布号 |
US9379074(B2) |
申请公布日期 |
2016.06.28 |
申请号 |
US201414250317 |
申请日期 |
2014.04.10 |
申请人 |
Invensas Corporation |
发明人 |
Uzoh Cyprian Emeka;Katkar Rajesh |
分类号 |
H01L23/00;H01L23/34;H01L23/48;H01L23/498 |
主分类号 |
H01L23/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. An apparatus, comprising:
a substrate; a first bond via array with first wire bond wires (“first wires”) each of a first length extending from a first surface of the substrate; an array of bump interconnects disposed on the first surface of the substrate; a die interconnected to the substrate via the array of bump interconnects coupled to a first surface of the die; and a second bond via array with second wire bond wires (“second wires”) each of a second length different than the first length extending from a second surface of the die opposite the first surface of the die. |
地址 |
San Jose CA US |