发明名称 Die stacks with one or more bond via arrays of wire bond wires and with one or more arrays of bump interconnects
摘要 An apparatus relating generally to a die stack is disclosed. In such an apparatus, a substrate is included. A first bond via array includes first wires each of a first length extending from a first surface of the substrate. An array of bump interconnects is disposed on the first surface. A die is interconnected to the substrate via the array of bump interconnects. A second bond via array includes second wires each of a second length different than the first length extending from a second surface of the die.
申请公布号 US9379074(B2) 申请公布日期 2016.06.28
申请号 US201414250317 申请日期 2014.04.10
申请人 Invensas Corporation 发明人 Uzoh Cyprian Emeka;Katkar Rajesh
分类号 H01L23/00;H01L23/34;H01L23/48;H01L23/498 主分类号 H01L23/00
代理机构 代理人
主权项 1. An apparatus, comprising: a substrate; a first bond via array with first wire bond wires (“first wires”) each of a first length extending from a first surface of the substrate; an array of bump interconnects disposed on the first surface of the substrate; a die interconnected to the substrate via the array of bump interconnects coupled to a first surface of the die; and a second bond via array with second wire bond wires (“second wires”) each of a second length different than the first length extending from a second surface of the die opposite the first surface of the die.
地址 San Jose CA US