发明名称 |
Pay-per-use access to multiple electronic test capabilities and tester resources |
摘要 |
A system and method for testing an electronic circuit is disclosed. The system includes a circuit board test platform having multiple electronic test capabilities and multiple hardware resources, and a pay-per-use module that is coupled to the circuit board test platform. The pay-per-use module is adapted for monitoring use of the multiple electronic test capabilities and the hardware resources of the circuit board test platform, and for debiting a number of usage credits from a usage credit pool based on the use of the multiple electronic test capabilities and the tester hardware resources.
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申请公布号 |
US5581463(A) |
申请公布日期 |
1996.12.03 |
申请号 |
US19940195435 |
申请日期 |
1994.02.14 |
申请人 |
HEWLETT-PACKARD CO |
发明人 |
CONSTANT, AMANDA L.;WEBB, DAVID W.;LATOURRETTE, SHARON E.;MYERS, JEFFREY C.;WITHERS-MIKLOS, KATHERINE Z.;LANNEN, KAY C.;TURNER, TED T.;LEONG, AMOS H. |
分类号 |
G01R31/00;G01R31/28;G06F11/34;G06Q30/00;G07F7/00;G07F7/02;G07F17/00;(IPC1-7):G07B15/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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