发明名称 REINFORCED PROBE NEEDLE FOR CONTROLLING THICKNESS THEREOF, FABRICATING METHOD THEREOF, AND PROBE CARD
摘要 PURPOSE: A reinforced probe needle for controlling thickness thereof, a fabricating method thereof, and a probe card are provided to fabricate the probe needle having a thickness less than 100 micrometers by controlling a diameter of the probe needle within a range between 25 micrometers and 125 micrometers. CONSTITUTION: A probe needle for probe card includes a core and a conductive layer. The core(110) is formed with a fine glass fiber. The conductive layer(120) is formed around the core. The conductive layer is formed with one selected from Au, Ti, Al, and W. The core has a diameter of 20 to 100 micrometers. The conductive layer has a thickness of 3 to 30 micrometers. An insulating layer is partially formed on an outer surface of the conductive layer.
申请公布号 KR20040088947(A) 申请公布日期 2004.10.20
申请号 KR20030023395 申请日期 2003.04.14
申请人 WON DAVE CHULHO 发明人 WON DAVE CHULHO
分类号 G01R1/067;(IPC1-7):G01R1/067 主分类号 G01R1/067
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