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发明名称
Bildbearbeitungsapparat und Verfahren zur Inspektion von Fehlern von Halbleiterbehältern.
摘要
申请公布号
DE68924092(T2)
申请公布日期
1996.03.21
申请号
DE19896024092T
申请日期
1989.05.10
申请人
KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA, JP
发明人
OZAKI, TAKAYUKI C/O INTELLECTUAL PROPERTY DIVISION, MINATO-KU TOKYO 105, JP
分类号
G01N21/88;G01N21/93;G01R31/26;G01R31/265;H01L21/56;H01L21/66;(IPC1-7):G06T7/40
主分类号
G01N21/88
代理机构
代理人
主权项
地址
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