| 摘要 |
PURPOSE: An apparatus for inspecting a back light unit is provided to easily detect defects by selectively transmitting light passing through a brightness enhancement film and the defects. CONSTITUTION: A CCFL(Cold Cathode Fluorescent Lamp) provides a linear light source. A light guide plate converts the linear light source into a surface light source. A diffusion plate diffuses the converted surface light source for equalizing the surface light source. A DBEF(Dual Brightness Enhancement Film)(35), which is a brightness enhancement film increases brightness of the equalized light source. A polarizing element(50) has a polarizing shaft vertical to the DBEF, so that the polarizing element interrupts light due to the DBEF while transmitting light by defects(40) generated at the DBEF. |
