发明名称 Ga2O3 semiconductor element
摘要 A Ga2O3 semiconductor element includes: an n-type β-Ga2O3 single crystal film, which is formed on a high-resistance β-Ga2O3 substrate directly or with other layer therebetween; a source electrode and a drain electrode, which are formed on the n-type β-Ga2O3 single crystal film; and a gate electrode, which is formed on the n-type β-Ga2O3 single crystal film between the source electrode and the drain electrode.
申请公布号 US9397170(B2) 申请公布日期 2016.07.19
申请号 US201214343367 申请日期 2012.09.07
申请人 TAMURA CORPORATION;NATIONAI INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY 发明人 Sasaki Kohei;Higashiwaki Masataka
分类号 H01L29/24;H01L29/78;H01L29/786;H01L29/812;H01L21/02;H01L29/772;H01L29/66;H01L29/04 主分类号 H01L29/24
代理机构 McGinn IP Law Group PLLC 代理人 McGinn IP Law Group PLLC
主权项 1. A Ga2O3-based semiconductor element, comprising: a β-Ga2O3 single crystal film that is formed on a main surface of a β-Ga2O3 substrate, the main surface being rotated from 50° to 90° with respect to a (100) plane; a source electrode and a drain electrode that are formed on a same side of the β-Ga2O3 single crystal film; a gate electrode that is formed on the β-Ga2O3 single crystal film between the source electrode and the drain electrode; a first region formed in the β-Ga2O3 single crystal film under the source electrode and the drain electrode and including a controlled first dopant concentration; and a second region formed to surround the first region and including a controlled second dopant concentration lower than the controlled first dopant concentration, wherein the β-Ga2O3 substrate includes a p-type dopant to be a high electrical resistance.
地址 Tokyo JP
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