发明名称 NITRIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A nitride semiconductor device is provided which reduces the contact resistance at the interface between a P-type electrode and a nitride semiconductor layer. A nitride semiconductor device includes a P-type nitride semiconductor layer and a P-type electrode formed on the P-type nitride semiconductor layer. The P-type electrode is formed by successive laminations of a metal layer of a metal having a work function of 5.1 eV or more, a Pd layer of palladium, and a Ta layer of tantalum on the P-type nitride semiconductor layer.
申请公布号 US2009160054(A1) 申请公布日期 2009.06.25
申请号 US20080269914 申请日期 2008.11.13
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 SHIOZAWA KATSUOMI;KANAMOTO KYOZO;OISHI TOSHIYUKI;TARUI YOICHIRO;TOKUDA YASUNORI
分类号 H01L21/283;H01L29/45 主分类号 H01L21/283
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