| 摘要 |
PROBLEM TO BE SOLVED: To obtain a magnetism measuring apparatus by which an offset adjusting speed and an offset adjusting accuracy are improved and which eliminates a need of an offset adjusting process in its manufacture. SOLUTION: A background magnetic field which is measured by a magnetism detecting element 1 and by a magnetism measuring circuit 2 is fetched by a CPU 6 through a differential amplifier 4 and an A/D converter 5. When a measured value V2 is at +10V or higher, one bit each is turned on and off from an MBS in a D/A converter 7, and a comparison is executed sequentially. When the measured value is within±10V, signal corresponding to the measured value is returned to the differential amplifier 4 from the D/A converter 7, the signal of the D/A converter 7 of the differential output 4 becomes zero, and the above processing operation is repeated.
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