发明名称 Phase shift mask including a substrate with recess
摘要 A phase shift mask includes a quartz substrate having a main surface partially dug, and a Cr film deposited on the main surface. The dug portion includes an undercut provided such that the Cr film partially serves as an eaves, and the Cr film has a pi opening exposing a portion of the dug portion, and a first subopening exposing an end of the dug portion.
申请公布号 US7306882(B2) 申请公布日期 2007.12.11
申请号 US20050133233 申请日期 2005.05.20
申请人 RENESAS TECHNOLOGY CORP. 发明人 AOYAMA SATOSHI
分类号 G03C5/00;G03F1/30;G03F1/68;G03F7/20;G03F9/00;H01L21/027 主分类号 G03C5/00
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