发明名称 EPITAXIAL METHODS AND TEMPLATES GROWN BY THE METHODS
摘要 <p>This invention provides methods for fabricating substantially continuous layers of a group III nitride semiconductor material having low defect densities and optionally having a selected crystal polarity. The methods include epitaxial growth nucleating and/or seeding on the upper portions of a plurality of pillars/islands of a group III nitride material that are irregularly arranged on a template structure. The upper portions of the islands have low defect densities and optionally have a selected crystal polarity. The invention also includes template structures having a substantially continuous layer of a masking material through which emerge upper portions of the pillars/islands. The invention can be applied to a wide range of elemental and compound semiconductor materials.</p>
申请公布号 WO2009015350(A1) 申请公布日期 2009.01.29
申请号 WO2008US71219 申请日期 2008.07.25
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES;ARIZONA BOARD OF REGENTS FOR AND ON BEHALF OF ARIZONA STATE UNIVERSITY;ARENA, CHANTAL;WERKHOVEN, CHRISTIAAN, J.;BERTRAM, JR., RONALD, THOMAS;LINDOW, ED;MAHAJAN, SUBHASH;DATTA, RANJAN;TRIVEDI, RAHUL, AJAY;HAN, ILSU 发明人 ARENA, CHANTAL;WERKHOVEN, CHRISTIAAN, J.;BERTRAM, RONALD, THOMAS, JR.;LINDOW, ED;MAHAJAN, SUBHASH;DATTA, RANJAN;TRIVEDI, RAHUL, AJAY;HAN, ILSU
分类号 H01L21/20 主分类号 H01L21/20
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