| 摘要 |
<p>A test object (13) is analyzed electronically, i.e. without the use of photographic film. The invention generates a pair of laterally-displaced images of the object (13) which interfere with each other to produce a pattern that can be recorded without a high-resolution detector. The object (13) is illuminated with at least partially coherent light. Reflected light (25, 27) from the object (13) is directed through a birefringent material (15), a lens system (17), a polarizer (19), and then to an image detector (21), such as a video camera. The birefringent material (15) causes non-parallel beams originating from a unique pair of points (29, 31) on the object to become nearly parallel, and orthogonally polarized. The polarizer (19) modifies the polarization of the parallel beams so that they will interfere with each other. Because the interfering light beams are nearly parallel, the spatial frequency of the interference pattern is sufficiently low that the pattern can be recorded by a low-resolution detector, such as a video camera. Interference patterns due to the superposition of two laterally-displaced images of the same object (13) are recorded while the object is in an undeformed and a deformed state. A computer (23) compares these interference patterns and produces a resultant pattern which depicts the deformation of the test object (13). Because photographic film is not needed, the invention can analyze objects very rapidly. Also, since the interference pattern is derived from pairs of distinct points on tDe object (13), the invention directly provides information on strain.</p> |
