发明名称 Semiconductor memory device having metal-insulator transition film resistor
摘要 A semiconductor memory device may have a lower leakage current and/or higher reliability, e.g., a longer retention time and/or a shorter refresh time. The device may include a switching device and a capacitor. A source of the switching device may be connected to a first end of a metal-insulator transition film resistor, and at least one electrode of the capacitor may be connected to a second end of the metal-insulator transition film resistor. The metal-insulator transition film resistor may transition between an insulator and a conductor according to a voltage supplied to the first and second ends thereof.
申请公布号 US2008316807(A1) 申请公布日期 2008.12.25
申请号 US20080230087 申请日期 2008.08.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HYUN JAE-WOONG;YOO IN-KYEONG;PARK YOON-DONG;CHO CHOONG-RAE;CHO SUNG-II
分类号 G11C11/00 主分类号 G11C11/00
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