发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent the malfunction of a semiconductor device, by using an npn-bipolar transistor as the transistor to be connected with the high-potential power source side of the output section and providing an n-channel MOS transistor, whose drain is connected with the input terminal and source and gate area connected to a lowpotential power source. CONSTITUTION:Since an npn-bipolar transistor Q5 is connected with the high- potential power source side of an output section, no parasitic diode is formed between the collector and emitter of the transistor Q5. Therefore, such a trouble that a semiconductor device with a three-state output wrongly operates when the power supply is turned off never takes place. Moreover, since an-channel MOS transistor Q8 is connected with an input section and the substrate area, in which the MOS transistor Q8 is formed, is connected with a GND terminal 3, a parasitic diode 21 is formed between the drain of the transistor Q8 and GND terminal 3 and a high static destruction resisting pressure is given to the input section by the action of the MOS transistor Q8. Therefore, the malfunction is prevented.
申请公布号 JPS641325(A) 申请公布日期 1989.01.05
申请号 JP19870157064 申请日期 1987.06.23
申请人 MITSUBISHI ELECTRIC CORP 发明人 OKIDAKA TAKENORI
分类号 H01L21/8234;H01L27/02;H01L27/06;H01L27/088;H03K19/003;H03K19/0175;H03K19/094;H03K19/0944 主分类号 H01L21/8234
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