发明名称 SCANNING ELECTRON MICROSCOPE
摘要 A scanning electron microscope suitable for imaging samples in a non-vacuum environment, the scanning electron microscope including an electron source located within an enclosure maintained under vacuum, an electron permeable membrane disposed at an opening of the enclosure separating an environment within the enclosure which is maintained under vacuum and an environment outside the enclosure which is not maintained under vacuum, the electron permeable membrane not being electrically grounded and at least one non-grounded electrode operative as an electron detector.
申请公布号 EP2959287(A4) 申请公布日期 2016.10.19
申请号 EP20140754707 申请日期 2014.02.18
申请人 B-NANO LTD. 发明人 SHACHAL, DOV;DE PICCIOTTO, RAFI
分类号 H01J37/18;H01J37/244;H01J37/28 主分类号 H01J37/18
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