发明名称 RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist composition having a large EL margin and capable of forming a resist pattern of a good profile, and to provide a resist pattern forming method. <P>SOLUTION: The resist composition contains a resin component (A), of which the alkali solubility increases by the action of an acid and an acid generator component (B) which generates an acid upon exposure to light, wherein the resin component (A) contains a resin (A1), having a constitutional unit (a1) represented by Formula (a1) and a constitutional unit (a2) represented by Formula (a2) [wherein R<SP>1</SP>is an acid decomposable group represented by Formula (I)], and wherein the acid generator component (B) contains an onium salt (B1), having an anionic moiety represented by Formula (b-5) [wherein U", V" and W", each independently represent a 1-10C alkyl group, in which at least one H atom has been substituted by an F atom]. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008046244(A) 申请公布日期 2008.02.28
申请号 JP20060220007 申请日期 2006.08.11
申请人 TOKYO OHKA KOGYO CO LTD 发明人 YONEMURA KOJI;HARADA NAONOBU;KAWANA DAISUKE
分类号 G03F7/039;C08L83/05;C08L83/07;G03F7/004;G03F7/075;H01L21/027 主分类号 G03F7/039
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