发明名称 |
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
A drift layer (20) is formed of a wide bandgap semiconductor. First well regions (30) are provided on the drift layer (20). Source regions (40) are provided on the first well regions (30), respectively. Gate insulating films (50) are provided on the first well regions (30). A first electrode (80) is in contact with the source regions (40), and has, among the first well regions (30), diode characteristics capable of performing unipolar conduction to the drift layer (20). A second well region (31) is provided on the drift layer (20). A second electrode (81) is in contact with the second well region (31), and is separated from a gate electrode (82) and the first electrode (80). |
申请公布号 |
WO2016170706(A1) |
申请公布日期 |
2016.10.27 |
申请号 |
WO2015JP81372 |
申请日期 |
2015.11.06 |
申请人 |
MITSUBISHI ELECTRIC CORPORATION |
发明人 |
SADAMATSU Koji;HINO Shiro |
分类号 |
H01L29/78;H01L21/336;H01L21/66;H01L27/04;H01L29/12;H01L29/861;H01L29/868;H01L29/872 |
主分类号 |
H01L29/78 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|