发明名称 SYSTEM AND METHOD FOR PROMPTLY AND ACCURATELY DETECTING AND RECORDING MANUFACTURE DEFECTS BY USING MULTI-VARIABLE IMAGE ANALYSIS WHILE MINIMIZING RECORDING OF NON-DEFECT AREA
摘要 PURPOSE: A system and a method for promptly and accurately detecting and recording manufacture defects of a copy by using multi-variable image analysis are provided to accurately identify various detects which are difficult to identify. CONSTITUTION: If an interested area of a copy is captured from an image file, the image file is preliminarily adjusted to correct the image file when necessary(208). The image file is additionally adjusted by using prearranged conversions in numbers corresponding to generation of n adjusted image files(212). If an interested area of a standard is captured from a data file, the data file is preliminarily adjusted to correct the data file when necessary(236). The data file is adjusted by using prearranged conversions to generate n adjusted data files(240). The adjusted image files are arranged with the adjusted data files for extracting residual detect signals including defect information by subtracting each image file from the corresponding data file(248,256).
申请公布号 KR20040076812(A) 申请公布日期 2004.09.03
申请号 KR20040012772 申请日期 2004.02.25
申请人 LAMDA-LITE ENTERPRISES INCORPORATED 发明人 VINCENT J. MESSINA;DONALD J. RONNING
分类号 H04N17/00;(IPC1-7):H04N17/00 主分类号 H04N17/00
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