| 摘要 |
A frame ( 10 ) for an x-ray inspection device comprises a structural member ( 16 ) to which is pivoted an arcuate frame ( 21 ). An x-ray source ( 12 ) is in use mounted directly to the member ( 16 ), and an x-ray detector ( 13 ) is movable around the frame ( 21 ). A three axis sample support for items to be imaged is arranged between the source ( 12 ) and detector ( 13 ). The frame ( 10 ) of the invention is particularly rigid
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