发明名称 Method to fill deep trench structures with void-free polysilicon or silicon
摘要 The present invention provides methods of producing trench structures having substantially void-free filler material therein. The fillers may be grown from a liner material such as polysilicon formed along the sidewalls of the trench. Previously formed voids may be healed by exposing the voids and growing epitaxial silicon.
申请公布号 US6809005(B2) 申请公布日期 2004.10.26
申请号 US20030386880 申请日期 2003.03.12
申请人 INFINEON TECHNOLOGIES AG;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 RANADE RAJIV;MATHAD GANGADHARA S.;CHAN KEVIN K.;KULKARNI SUBHASH B.
分类号 H01L21/205;H01L21/334;H01L21/763;H01L21/8242;(IPC1-7):H01L21/76 主分类号 H01L21/205
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