发明名称 Method of measuring reduction of surface layer material and apparatus therefor.
摘要 <p>A method in which a surface layer material whose amount of reduction is to be measured is activated to find a distribution ratio of two or more kinds of radioactive nuclides that are produced in the space in the surface layer of the material, and the distribution ratio is used as an index for the amount of reduction of surface layer material. The amount of reduction in the surface layer material is measured in situ, nondestructively, easily and irrespectively of obstacles and the distance that exist between the detector and the material that is to be measured.</p>
申请公布号 EP0386687(A2) 申请公布日期 1990.09.12
申请号 EP19900104243 申请日期 1990.03.06
申请人 GEN SEKIYU KK;KOSAKA TOSHISO 发明人 KOSAKO, TOSHISO;NISHIMURA, KAZUO
分类号 G01N23/222 主分类号 G01N23/222
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