发明名称 Method and apparatus for testing encapsulated circuits
摘要 A method and apparatus for evaluating the suitability of an encapsulated electrical circuit for use in a particular service environment provides for immersing the encapsulated circuit in a slightly conductive evaluating fluid whose chemical composition approximates the environment into which the circuit will be placed in service. The thus-immersed circuit is then subjected to a reduced-pressure testing environment to draw air and other retained gases out of internal voids within the encapsulated circuit. The pressure of the testing environment is slowly increased to cause the encapsulated circuit to ingest a quantity of the evaluating fluid. An input signal is then applied to the circuit and the circuit's response to the input signal is monitored over a predetermined time period.
申请公布号 US5847574(A) 申请公布日期 1998.12.08
申请号 US19960778385 申请日期 1996.12.31
申请人 MCDONNELL DOUGLAS CORPORATION 发明人 BERRY, JR., JOHN C.;FOGG, LARRY L.
分类号 G01R31/28;(IPC1-7):G01R31/26 主分类号 G01R31/28
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