发明名称 STAGE DEVICE OF SUBSTRATE, INSPECTING DEVICE, AND CORRECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a stage device of a substrate capable of reducing damage, and an inspecting device using the same. SOLUTION: The stage device includes a stage 7 on which the substrate 6 is mounted and an up-and-down pin 21 placed at a position corresponding to a through-hole 11 formed at the stage 7 which is structured to be capable of rising and lowering to support the substrate 6 from below the substrate 6. A spout for jetting gas to the substrate 6 is formed at the tip of the pin 21. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006344705(A) 申请公布日期 2006.12.21
申请号 JP20050167702 申请日期 2005.06.08
申请人 LASERTEC CORP 发明人 YAMAZAKI TERUAKI;MORIIZUMI KOICHI;SEKI HIROKAZU
分类号 H01L21/683 主分类号 H01L21/683
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