发明名称 |
FREQUENCY CHARACTERISTIC EVALUATING DEVICE, TDR WAVEFORM MEASURING INSTRUMENT, AND PROGRAM FOR FREQUENCY CHARACTERISTIC EVALUATING DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a frequency characteristic evaluating device capable of calculating the frequency characteristic of a signal wire without the need for a special sample or a special signal generator. Ž<P>SOLUTION: The device includes: input means (1) for setting waveform data on a time domain concerning an incident wave of staircase waveform to a signal wire that is to be measured and a reflected wave with respect to the incident wave; a storage section (2) in which the waveform data is stored; impulse response extracting means (6) for extracting an impulse response by time-differentiating waveform data on the incident and reflected waves in accordance with the waveform data; Fourier transform means (7) for calculating an amplitude distribution for each frequency of the waveforms of the incident and reflected waves by Fourier transform of the impulse response; reflection coefficient calculating means (8) for calculating a reflection coefficient by calculating an amplitude ratio for each frequency from the amplitude distribution of the waveforms of the incident and reflected waves; and frequency characteristic calculating means (4) for calculating the frequency characteristic of the characteristic impedance of the signal wire in accordance with the reflection coefficient. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010019865(A) |
申请公布日期 |
2010.01.28 |
申请号 |
JP20090248972 |
申请日期 |
2009.10.29 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
YAMAGISHI KEITARO;OHASHI HIDEMASA |
分类号 |
G01R27/26 |
主分类号 |
G01R27/26 |
代理机构 |
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地址 |
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