发明名称 METHOD AND APPARATUS FOR DRY ETCHING
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and an apparatus for dry etching that can improve etching efficiency at the time when dry etching of resist is performed, can improve working efficiency by shortening an etching time, and can prevent the damage of a processing object and the deterioration of its properties. Ž<P>SOLUTION: In a dry etching apparatus equipped with a chamber 10 that etches the processing object, shielding plates 30 consisting of Ta, Ti or an alloy containing Ta or Ti are arranged in the chamber. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010021440(A) 申请公布日期 2010.01.28
申请号 JP20080181900 申请日期 2008.07.11
申请人 FUJITSU LTD 发明人 SUGIMOTO KOICHI
分类号 H01L21/3065 主分类号 H01L21/3065
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