MEASURING APPARATUS, MEASURING METHOD, TESTING APPARATUS, ELECTRONIC DEVICE AND PROGRAM

摘要

Provided is a measuring apparatus for measuring jitter generated in a data converter. The measuring apparatus is provided with a measurement signal generating section for generating a substantially constant periodic measurement signal; a jitter applying section which applies jitter of a deterministic signal having a previously determined jitter period to the measurement signal and inputs the measurement signal to the data converter; a jitter measuring section for measuring a jitter sequence of a digital signal outputted from the data converter; and an extracting section which extracts data of the jitter sequence, in accordance with the jitter period of the jitter applied by the jitter applying section. A testing apparatus and the like using such measuring apparatus are also provided.