| 摘要 |
PROBLEM TO BE SOLVED: To provide a measurement value correcting method, a measurement value correcting program, and a measuring device, capable of performing optimum correction tailored to the shape of the workpiece to be measured.SOLUTION: A measurement value correcting method for correcting the measurement value obtained by tracing a surface of a workpiece by a stylus comprises the steps of: preparing a plurality of workpieces manufactured from the same design data; obtaining a reference measurement value by measuring one of the plurality of workpieces as a master workpiece by a stylus (step S101); obtaining calibration data based on the difference between the reference measurement value and the design data (step S102); obtaining a target measurement value by measuring the workpieces other than the master workpiece among the plurality of workpieces as the workpiece to be measured by the stylus (step S103); and obtaining a corrected measurement value by correcting the target measurement value using the calibration data (step S104).SELECTED DRAWING: Figure 5 |
