发明名称 Tilted array geometry for improved MRAM switching
摘要 An array of conductive lines for MRAM circuits wherein at least one set of mutually parallel conductive traces is tilted with respect to being perpendicular with a corresponding set of mutually parallel conductive traces wherein individual conductive traces within the sets intersect adjacent individual MRAM cells and wherein the tilting of the at least one set of conductive traces acts to induce both a vertical and horizontal component of a magnetic field such that the net vector addition of magnetic fields induced by the sets of conductive traces is greater than the untilted or perpendicular configuration so as to induce a greater net magnetic field to effect more reliable switching of the underlying MRAM cells. The tilted array also enables reducing the current supplied by the conductive traces while maintaining a comparable net magnetic field to the untilted configuration.
申请公布号 US6917087(B2) 申请公布日期 2005.07.12
申请号 US20030371986 申请日期 2003.02.21
申请人 MICRON TECHNOLOGY, INC. 发明人 CHEN GUOQING
分类号 H01L21/76;H01L27/22;H01L29/82;(IPC1-7):H01L21/76 主分类号 H01L21/76
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