发明名称 |
Semiconductor device and method of fabricating the same |
摘要 |
A semiconductor device includes a semiconductor substrate including a group III element and a group V element, and a gate structure on the semiconductor substrate. The semiconductor substrate includes a first region which contacts a bottom surface of the gate 5 structure and a second region which is disposed under the first region. The concentration of the group III element in the first region is lower than that of the group V element in the first region, and the concentration of the group III element in the second region is substantially equal to that of the group V element in the second region. |
申请公布号 |
US9515186(B2) |
申请公布日期 |
2016.12.06 |
申请号 |
US201514602660 |
申请日期 |
2015.01.22 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lim Ha-Jin;Kim Hyeong-Joon;Lee Nae-In |
分类号 |
H01L29/76;H01L29/78;H01L21/8238;H01L29/66;H01L27/092 |
主分类号 |
H01L29/76 |
代理机构 |
Onello & Mello, LLP |
代理人 |
Onello & Mello, LLP |
主权项 |
1. A semiconductor device comprising:
a semiconductor substrate comprising a group III element and a group V element; and a gate structure on the semiconductor substrate, wherein the semiconductor substrate comprises:
a first region directly contacting a bottom surface of the gate structure; anda second region disposed under the first region,wherein the concentration of the group III element in the first region is lower than that of the group V element in the first region, and the concentration of the group III element in the second region is substantially equal to that of the group V element in the second region. |
地址 |
KR |