发明名称 Method for forming interconnections in an integrated circuit
摘要 The invention provides a method for producing wiring and contacts in an integrated circuit including the steps of forming insulated gate components on a semiconductor substrate; applying a photo-reducible dielectric layer to cover the substrate; etching holes and forming contacts; photo-reducing the dielectric to increase its conductivity; covering the resulting structure with an interconnect layer; etching the interconnect layer to define wiring in electrical contact with the contacts; and oxidizing the dielectric to reduce its conductivity.
申请公布号 US5851919(A) 申请公布日期 1998.12.22
申请号 US19970851803 申请日期 1997.05.06
申请人 SGS-THOMSON MICROELECTRONICS S.A. 发明人 PAPADAS, CONSTANTIN
分类号 H01L21/3213;H01L21/768;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/3213
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