发明名称 |
Interconnect structure for CIS flip-chip bonding and methods for forming the same |
摘要 |
A device includes a metal pad at a surface of an image sensor chip, wherein the image sensor chip includes an image sensor. A stud bump is disposed over, and electrically connected to, the metal pad. The stud bump includes a bump region, and a tail region connected to the bump region. The tail region includes a metal wire portion substantially perpendicular to a top surface of the metal pad. The tail region is short enough to support itself against gravity. |
申请公布号 |
US9397137(B2) |
申请公布日期 |
2016.07.19 |
申请号 |
US201414530214 |
申请日期 |
2014.10.31 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Yu Chen-Hua;Chen Yung Ching;Lee Chien-Hsun;Lii Mirng-Ji |
分类号 |
H01L23/48;H01L27/146;H01L31/02 |
主分类号 |
H01L23/48 |
代理机构 |
Slater & Matsil, LLP |
代理人 |
Slater & Matsil, LLP |
主权项 |
1. A method comprising:
forming a stud bump on a surface of an image sensor chip, wherein the stud bump comprises a bump region, and a tail region connected to the bump region, and wherein the tail region is short enough to support itself against gravity; and bonding a substrate to the image sensor chip through the stud bump, wherein the substrate comprises:
a first portion overlapping a portion of the image sensor chip, wherein the first portion of the substrate comprises an electrical connector in contact with the tail region of the stud bump; anda second portion connected to the first portion, wherein the second portion extends along sidewalls of the image sensor chip and comprises a lower end level with a bottom surface of the image sensor chip. |
地址 |
Hsin-Chu TW |