发明名称 Interconnect structure for CIS flip-chip bonding and methods for forming the same
摘要 A device includes a metal pad at a surface of an image sensor chip, wherein the image sensor chip includes an image sensor. A stud bump is disposed over, and electrically connected to, the metal pad. The stud bump includes a bump region, and a tail region connected to the bump region. The tail region includes a metal wire portion substantially perpendicular to a top surface of the metal pad. The tail region is short enough to support itself against gravity.
申请公布号 US9397137(B2) 申请公布日期 2016.07.19
申请号 US201414530214 申请日期 2014.10.31
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Yu Chen-Hua;Chen Yung Ching;Lee Chien-Hsun;Lii Mirng-Ji
分类号 H01L23/48;H01L27/146;H01L31/02 主分类号 H01L23/48
代理机构 Slater & Matsil, LLP 代理人 Slater & Matsil, LLP
主权项 1. A method comprising: forming a stud bump on a surface of an image sensor chip, wherein the stud bump comprises a bump region, and a tail region connected to the bump region, and wherein the tail region is short enough to support itself against gravity; and bonding a substrate to the image sensor chip through the stud bump, wherein the substrate comprises: a first portion overlapping a portion of the image sensor chip, wherein the first portion of the substrate comprises an electrical connector in contact with the tail region of the stud bump; anda second portion connected to the first portion, wherein the second portion extends along sidewalls of the image sensor chip and comprises a lower end level with a bottom surface of the image sensor chip.
地址 Hsin-Chu TW