发明名称 Attachable/detachable variable spacing probing tip system
摘要 An attachable/detachable variable spacing probing tip system has a housing that receives pivoting probing arms. Each probing arm has a support member and a probing arm portion of a flexible substrate having a conductive trace thereon. One end of each conductive trace is coupled to a probing contact and the other end coupled to an electrical contact pad on a electrical contact pad portion of the flexible substrate. Each of the probing arm portions has a generally S-shaped fold therein extending from the support members to the electrical contact portion of the flexible substrate. The housing includes means for pivoting the probing arms. The rear surface of the housing has a resilient member disposed therein. Latching means in the housing secures the electrical contact pad portion of the flexible substrate to the rear surface of the housing. Opposing attachment arms from a rear surface of the housing.
申请公布号 US6967473(B1) 申请公布日期 2005.11.22
申请号 US20040856376 申请日期 2004.05.27
申请人 TEKTRONIX, INC. 发明人 REED GARY W.;MARTIN JIM L.;POOLEY WILLIAM R.;HAGERUP WILLIAM A.
分类号 G01R1/06;G01R1/067;G01R31/02;(IPC1-7):G01R1/06 主分类号 G01R1/06
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