发明名称 Diffraction imaging
摘要 A method of imaging phases in an inhomogeneous polycrystalline sample having a plurality of crystallites of at least a first crystalline component includes illuminating an illuminated area extending across a surface of a sample with substantially monochromatic X-rays incident at a Bragg-Brentano parafocussing geometry at first angle θ1 to the surface of the sample. X-rays diffracted by the sample at a second angle θ2 pass through a pinhole. The diffraction angle θ1+θ2 fulfils a Bragg condition for the first crystalline component which is imaged by a detector to provide a two-dimensional image of the first crystalline component at the surface of the sample.
申请公布号 US9506880(B2) 申请公布日期 2016.11.29
申请号 US201414311659 申请日期 2014.06.23
申请人 PANALYTICAL B.V. 发明人 Beckers Detlef;Gateshki Milen
分类号 G01N23/207;G01N23/205;G01N23/20 主分类号 G01N23/207
代理机构 Leason Ellis LLP 代理人 Leason Ellis LLP
主权项 1. A method of imaging an inhomogeneous polycrystalline sample having a plurality of crystallites of at least a first crystalline component, comprising: illuminating an illuminated area extending across a surface of a sample with substantially monochromatic X-rays from an incident beam focus, the substantially monochromatic X-rays being incident at a first angle θ1 to the surface of the sample; and passing X-rays diffracted by the sample at a second angle θ2 through a pinhole arrangement, wherein the diffraction angle θ1+θ2 fulfils a Bragg condition for the first crystalline component, and the pinhole arrangement is located at a position determined by a parafocus condition, the X-rays passing through the pinhole arrangement and onto a detector spaced from the pinhole arrangement, wherein the pinhole arrangement provides a two-dimensional image of the first crystalline component at a surface of the sample on the detector.
地址 Almelo NL
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