发明名称 | Diffraction imaging | ||
摘要 | A method of imaging phases in an inhomogeneous polycrystalline sample having a plurality of crystallites of at least a first crystalline component includes illuminating an illuminated area extending across a surface of a sample with substantially monochromatic X-rays incident at a Bragg-Brentano parafocussing geometry at first angle θ1 to the surface of the sample. X-rays diffracted by the sample at a second angle θ2 pass through a pinhole. The diffraction angle θ1+θ2 fulfils a Bragg condition for the first crystalline component which is imaged by a detector to provide a two-dimensional image of the first crystalline component at the surface of the sample. | ||
申请公布号 | US9506880(B2) | 申请公布日期 | 2016.11.29 |
申请号 | US201414311659 | 申请日期 | 2014.06.23 |
申请人 | PANALYTICAL B.V. | 发明人 | Beckers Detlef;Gateshki Milen |
分类号 | G01N23/207;G01N23/205;G01N23/20 | 主分类号 | G01N23/207 |
代理机构 | Leason Ellis LLP | 代理人 | Leason Ellis LLP |
主权项 | 1. A method of imaging an inhomogeneous polycrystalline sample having a plurality of crystallites of at least a first crystalline component, comprising: illuminating an illuminated area extending across a surface of a sample with substantially monochromatic X-rays from an incident beam focus, the substantially monochromatic X-rays being incident at a first angle θ1 to the surface of the sample; and passing X-rays diffracted by the sample at a second angle θ2 through a pinhole arrangement, wherein the diffraction angle θ1+θ2 fulfils a Bragg condition for the first crystalline component, and the pinhole arrangement is located at a position determined by a parafocus condition, the X-rays passing through the pinhole arrangement and onto a detector spaced from the pinhole arrangement, wherein the pinhole arrangement provides a two-dimensional image of the first crystalline component at a surface of the sample on the detector. | ||
地址 | Almelo NL |