Socket for contacting an electronic circuit during testing

摘要

An electronic circuit tester for measuring the response to electrical signals applied to an electronic circuit under test is provided with a socket for effecting connection between a packaged device or integrated circuit being tested to a device-under-test (DUT) board incorporated into a fixture board of the tester. The socket includes an electrically insulative housing having at least one longitudinal slot and two transverse channels, an elastomeric member disposed in each of the channels and spanning the width of the slot, an electrically conductive contact frame disposed in the slot and mechanically biased by the elastomeric members against the DUT board, and an electrically conductive contact in sliding contact with the contact frame, the contact having a first end configured to electrically contact the lead of the electronic circuit with a second end of the contact being in engagement with the second elastomeric member to mechanically bias the first end of the contact against the lead of the electronic circuit. The socket increases repeatability of connections and accuracy of measurements with the electronic circuit tester.