发明名称 Differential mechanical stress-producing regions for integrated circuit field effect transistors
摘要 Integrated circuit field effect transistors include a substrate, an isolation region in the substrate that defines an active region in the substrate, spaced apart source/drain regions in the active region, a channel region in the active region between the spaced apart source/drain regions and an insulated gate on the channel region. A differential mechanical stress-producing region is configured to produce different mechanical stress in the channel region adjacent the isolation region compared to remote from the isolation region. The differential mechanical stress-producing region may be formed using patterned stress management films, patterned stress-changing implants and/or patterned silicide films, and can reduce undesired comer effects. Related fabrication methods also are described.
申请公布号 US7307320(B2) 申请公布日期 2007.12.11
申请号 US20050268131 申请日期 2005.11.07
申请人 SAMSUNG ELECTRONICS CO., LTD.;CHARTERED SEMICONDUCTOR MANUFACTURING LTD. 发明人 SUN MIN-CHUL;TEH YOUNG WAY
分类号 H01L29/76;H01L29/94 主分类号 H01L29/76
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