| 摘要 |
[Solution] According to the present invention, a signal processing device is included in an optical tomographic measuring device which generates a measurement light and a reference light, and which measures a tomographic structure of a subject to be measured on the basis of signal intensity of interference light between the reference light and return light of the measurement light from the subject to be measured. The calculation unit is configured to calculate the signal intensity of a simple reflection that is a reflection, of the return light of the measurement light, at each of a plurality of layers virtually set toward the depth direction from the surface layer side of the subject to be measured. In addition, the calculation unit is configured to calculate, on the basis of the signal intensity of the simple reflection, the signal intensity of multiple reflections which is the signal intensity of return light generated by being reflected for three times or more at the plurality of layers. |
