发明名称 MASK PATTERNS WITH SPACERS FOR PITCH MULTIPLICATION AND METHODS OF FORMING THE SAME
摘要 Spacers (175) in a pitch multiplication process are formed without performing a spacer etch. Rather, mandrels (145) are formed over a substrate (110) and then the sides of the mandrels (145) are reacted, e.g., in an oxidization, nitridation, or silicidation step, to form a material that can be selectively removed relative to the unreacted portions of the mandrel (145). The unreacted portions are selectively removed to leave a pattern of free- standing spacers (175). The free-standing spacers (175) can serve as a mask for subsequent processing steps, such as etching the substrate (110).
申请公布号 WO2007027686(A3) 申请公布日期 2007.05.03
申请号 WO2006US33703 申请日期 2006.08.28
申请人 MICRON TECHNOLOGY, INC. 发明人 SANDHU, GURTEJ, S.;PRALL, KIRK, D.
分类号 H01L21/033;H01L21/027;H01L21/308;H01L21/321 主分类号 H01L21/033
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