| 摘要 |
PROBLEM TO BE SOLVED: To provide a microscope examination apparatus which, when an external force is applied to the distal end of an objective lens in a direction intersecting the optical axis thereof, effectively relieves the external force, thereby maintaining the integrity of the objective lens and specimen. SOLUTION: The microscope examination apparatus includes a base member 3 secured to an apparatus body, an objective lens mounting member 5 for mounting an objective lens unit 4, and a support mechanism 6 for supporting the objective lens mounting member 5 so as to be movable relative to the base member 3 in a direction intersecting the optical axis C of the objective lens unit 4. The support mechanism 6 is equipped with an inner flange 17c installed in either the base member 3 or the objective lens mounting member 5, an outer flange 15 installed in the other one of these members and capable of engaging with the inner flange 17c axially, and a pressing member 19 for pressing these flanges in the direction sticking them closely in the axial direction. In the inner flange 17c and the outer flange 15, there are provided notches for releasing axial engagement when the flanges are arranged at a prescribed relative rotational angle around the optical axis C. COPYRIGHT: (C)2007,JPO&INPIT
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